Prediction of analog performance parameters using fast transient testing

Prediction of analog performance parameters using fast transienttesting

In this paper, a fast transient testing methodology for predicting the performance parameters of analog circuits is presented. A transient test signal is applied to the circuit under (cut) test and the transient response of the circuit is sampled and analyzed to predict the circuit’s performance parameters. An algorithm for generating the optimum transient test signal is presented. The methodol...

Look up Table Based Low Power Analog Circuit Testing

In this paper, a method of low power analog testing is proposed. In spite of having Oscillation Based Built in Self-Test methodology (OBIST), a look up table based (LUT) low power testing approach has been proposed to find out the faulty circuit and also to sort out the particular fault location in the circuit. In this paper an operational amplifier, which is the basic building block in the ana...

Performance Testing of Logarithmic Analog- To-digital Converters

Abstract This paper describes test procedures to characterize the behavior of logarithmic analog-to-digital converters. Logarithmic A/D converters are usually characterized in terms of signal-to-noise ratio (SNR) or in deviation of the ideal characteristic in dB. There are a lack of test methods definition in the literature, as can be observed in the IEEE standard 1241 for these type of convert...

Prediction of Gas Lift Parameters Using Artificial Neural Networks

Testing for improvement in prediction model performance.

Authors have proposed new methodology in recent years for evaluating the improvement in prediction performance gained by adding a new predictor, Y, to a risk model containing a set of baseline predictors, X, for a binary outcome D. We prove theoretically that null hypotheses concerning no improvement in performance are equivalent to the simple null hypothesis that Y is not a risk factor when co...